Buy RM747D 883B Microcircuit Linear part by Fairchild Semiconductor Corp

Part Number: RM747D 883B

Manufacturer: fairchild semiconductor corp

NSN: 5962-00-173-1427

NIIN: 001731427

Item Name : microcircuit linear

CAGE Code: 07933

FSC: 5962 Microcircuits Electronic

INC Code: 31778

Country: USA

NCB Code: 00

FSG: 59 Electrical and Electronic Equipment Components

We've received your request for RM747D 883B (described as Microcircuit Linear), manufactured by Fairchild Semiconductor Corp with CAGE code 07933. This part is registered under NSN 5962-00-173-1427, classified in FSG 59 Electrical and Electronic Equipment Components / FSC 5962 Microcircuits Electronic. Our verification process will confirm traceability through supporting identifiers including NIIN 00-173-1427, NCB code 00 (origin: USA), and INC 31778. Please submit your formal quotation request to proceed.

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NSN Information for Part Number RM747D 883B with NSN 5962-00-173-1427, 5962001731427

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-00-173-1427 Item PartTypeName: MICROCIRCUIT,LINEAR	5962	001731427		N	B
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
			B	U
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
15-52747J1	1	2	5

Characteristics Data of NSN 5962-00-173-1427, 5962001731427

MRC	Criteria	Characteristic
ADAQ	BODY LENGTH	0.755 INCHES MINIMUM AND 0.785 INCHES MAXIMUM
ADAT	BODY WIDTH	0.265 INCHES MINIMUM AND 0.291 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.150 INCHES MINIMUM AND 0.199 INCHES MAXIMUM
AEHX	MAXIMUM POWER DISSIPATION RATING	670.0 MILLIWATTS
AFGA	OPERATING TEMP RANGE	-55.0 TO 125.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-65.0 TO 150.0 DEG CELSIUS
CBBL	FEATURES PROVIDED	MONOLITHIC AND HERMETICALLY SEALED AND HIGH GAIN AND LOW POWER AND NEGATIVE OUTPUTS AND POSITIVE OUTPUTS AND INTERNALLY COMPENSATED
CQSJ	INCLOSURE MATERIAL	CERAMIC AND GLASS
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
CQZP	INPUT CIRCUIT PATTERN	DUAL 2 INPUT
CWSG	TERMINAL SURFACE TREATMENT	TIN
CZEQ	TIME RATING PER CHACTERISTIC	300.00 NANOSECONDS NOMINAL PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).

Schedule B & Trade

End Use : 21320	Semiconductors
Schedule B : 8542900000 (NAICS 334413)	Electronic integrated circuits and microassembly parts
SITC : 77689	Parts of electronic integrated circuits and microassembles

Identification

CRITL	The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
ESD	B - Represents items with esd sensitivity.
HMIC	N - Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials.
PMIC	U - Precious metal content is unknown

NSN Management Codes

AAC	V
Classification Control	U
MGMT_CTL	15e2b--
Quantity per pack	1
Repariability	This is a nonreparable item. if condemned or economically unserviceable, then dispose at the level authorized replace the item.
Shelf Life	N/A
SOS	S9e
Unit of Measure	Ea

Freight Information

ACC:	H - Instruments/equipment/supplies for radio, communications, electrical, laboratory, etc. (includes signal corps)
ADC:	A - Shipment is not a consolidation and does not exceed 84 inches in any dimension.
LTL:	W - Rating variable
NMFC:	061700 - Elec appliances/instruments noi
SHC:	9 - Other or no special handling required (sh)
TCC:	Z - No special type of cargo code applicable
WCC:	72D - Communications/electronics, other than sigint/ew or comsec repair parts and components